OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Materials Science Forum Année : 2003

OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension

Résumé

Silicon carbide has suitable properties for high power electronic applications. We present here results on 6H-SiC bipolar diodes protected by Junction Termination Extension. We have achieved breakdown voltage of ~1200 V, which is close to the theoretical value, and forward current density of 120 A cm-2 at 5 V. Optical Beam Induced Current measurements and simulations have shown that JTE are very efficient and that their parameters are close to the optimum. Nevertheless, a little increase of their doping level should increase the breakdown voltage up to ~1400 V.
Fichier principal
Vignette du fichier
fullarticle-obic-v6.pdf (364.01 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04091213 , version 1 (07-05-2023)

Identifiants

Citer

S.R. Wang, Christophe Raynaud, Dominique Planson, Mihai Lazar, Jean-Pierre Chante. OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension. Materials Science Forum, 2003, 433-436, pp.863-866. ⟨10.4028/www.scientific.net/MSF.433-436.863⟩. ⟨hal-04091213⟩
14 Consultations
2 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More