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Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2023

Understanding the Link Between Complex Digital Devices Soft Error Rate and the Running Software

Résumé

Due to their complex architecture, the radiation sensitivity of general-purpose processors is intrinsically linked to the software that is executed. In order to obtain a consistent assessment of the fault tolerance during radiation experiments, it is necessary to have software representative of the final application. For this purpose, we are developing a methodology based on the application profiling tool that allows us to have a detailed view of the use of hardware resources according to the software profile. This analysis flow has been applied on a reduced instruction set computer (RISC-V) softcore for different applications allowing us to formulate a link between the fault tolerance and the software profile.

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Dates et versions

hal-04193886 , version 1 (01-09-2023)

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Paternité - Pas d'utilisation commerciale

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Citer

Luc Noizette, Florent Miller, Thierry Colladant, Youri Helen, Régis Leveugle. Understanding the Link Between Complex Digital Devices Soft Error Rate and the Running Software. IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1747-1754. ⟨10.1109/TNS.2023.3284899⟩. ⟨hal-04193886⟩

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